endOfImageTelemetry
- Description: Event sent once all telemetry correesponding to the image has been sent. (Typically ~300mS after the end of readout).
- Note: all : delimited strings (aka string arrays) follow the escaping convention defined in CAP-572
EFDB_Topic: | ATCamera_logevent_endOfImageTelemetry |
additionalKeys
IDL_Type: | string |
Units: | unitless |
Description: Additional keys passed to the takeImages command (: delimited)
additionalValues
IDL_Type: | string |
Units: | unitless |
Description: Additional values passed to the takeImages command (: delimited, in same order as additionalKeys)
imagesInSequence
IDL_Type: | long |
Units: | unitless |
Description: The total number of requested images in sequence
imageName
IDL_Type: | string |
IDL_Size: | 32 |
Units: | unitless |
Description: The imageName for this specific exposure, assigned by the camera
imageIndex
IDL_Type: | long |
Units: | unitless |
Description: The zero based index number for this specific exposure within the sequence
imageSource
IDL_Type: | string |
IDL_Size: | 2 |
Units: | unitless |
Description: The source component of the image name (AT/CC/MC)
imageController
IDL_Type: | string |
Units: | unitless |
Description: The controller for the image (O=OCS/C=CCS/…)
imageDate
IDL_Type: | string |
IDL_Size: | 8 |
Units: | unitless |
Description: The date component of the image name (YYYYMMDD)
imageNumber
IDL_Type: | long |
Units: | unitless |
Description: The image number (SEQNO) component of the image name
timestampAcquisitionStart
IDL_Type: | double |
Units: | second |
Description: The effective time at which the image acquisition started (i.e. the end of the previous clear or readout)
exposureTime
IDL_Type: | double |
Units: | second |
Description: The requested exposure time
imageTag
IDL_Type: | string |
IDL_Size: | 64 |
Units: | unitless |
Description: The DAQ assigned image tag (hex string)
timestampDateObs
IDL_Type: | double |
Units: | second |
Description: The observation date, as computed by CCS (as TAI)
timestampDateEnd
IDL_Type: | double |
Units: | second |
Description: The end observation date, as computed by CCS (as TAI)
measuredShutterOpenTime
IDL_Type: | double |
Units: | second |
- Description: The measured shutter open time, as computed by CCS. This is a best estimate based on a summary of the full information provided
- in the shutterBladeMotionProfile events.
darkTime
IDL_Type: | double |
Units: | second |
Description: The dark time, as computed by CCS
focalPlaneRebRaftsPowerSettingsApplied
EFDB_Topic: | ATCamera_logevent_focalPlaneRebRaftsPowerSettingsApplied |
version
IDL_Type: | long |
Units: | unitless |
Description: Version number of these settings
bias0_gdCal
IDL_Type: | double |
Units: | unitless |
Description: GD convert factor
bias0_gdTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for GD
bias0_gdTol
IDL_Type: | double |
Units: | volt |
Description: Guard diode tolerance
bias0_gdValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for GD at TestVolts
bias0_gdZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for GD at 0V
bias0_odCal
IDL_Type: | double |
Units: | unitless |
Description: OD convert factor
bias0_odIMax
Description: Max ODI value
bias0_odTol
IDL_Type: | double |
Units: | volt |
Description: Output drain tolerance
bias0_odZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for OD at 0V
bias0_ogCal
IDL_Type: | double |
Units: | unitless |
Description: OG convert factor
bias0_ogTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for OG
bias0_ogTol
IDL_Type: | double |
Units: | volt |
Description: Output gate tolerance
bias0_ogValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for OG at TestVolts
bias0_ogZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for OG at 0V
bias0_rdCal
IDL_Type: | double |
Units: | unitless |
Description: RD convert factor
bias0_rdTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for RD
bias0_rdTol
IDL_Type: | double |
Units: | volt |
Description: Reset drain tolerance
bias0_rdValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for RD at TestVolts
bias0_rdZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for RD at 0V
bias1_gdCal
IDL_Type: | double |
Units: | unitless |
Description: GD convert factor
bias1_gdTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for GD
bias1_gdTol
IDL_Type: | double |
Units: | volt |
Description: Guard diode tolerance
bias1_gdValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for GD at TestVolts
bias1_gdZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for GD at 0V
bias1_odCal
IDL_Type: | double |
Units: | unitless |
Description: OD convert factor
bias1_odIMax
Description: Max ODI value
bias1_odTol
IDL_Type: | double |
Units: | volt |
Description: Output drain tolerance
bias1_odZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for OD at 0V
bias1_ogCal
IDL_Type: | double |
Units: | unitless |
Description: OG convert factor
bias1_ogTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for OG
bias1_ogTol
IDL_Type: | double |
Units: | volt |
Description: Output gate tolerance
bias1_ogValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for OG at TestVolts
bias1_ogZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for OG at 0V
bias1_rdCal
IDL_Type: | double |
Units: | unitless |
Description: RD convert factor
bias1_rdTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for RD
bias1_rdTol
IDL_Type: | double |
Units: | volt |
Description: Reset drain tolerance
bias1_rdValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for RD at TestVolts
bias1_rdZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for RD at 0V
bias2_gdCal
IDL_Type: | double |
Units: | unitless |
Description: GD convert factor
bias2_gdTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for GD
bias2_gdTol
IDL_Type: | double |
Units: | volt |
Description: Guard diode tolerance
bias2_gdValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for GD at TestVolts
bias2_gdZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for GD at 0V
bias2_odCal
IDL_Type: | double |
Units: | unitless |
Description: OD convert factor
bias2_odIMax
Description: Max ODI value
bias2_odTol
IDL_Type: | double |
Units: | volt |
Description: Output drain tolerance
bias2_odZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for OD at 0V
bias2_ogCal
IDL_Type: | double |
Units: | unitless |
Description: OG convert factor
bias2_ogTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for OG
bias2_ogTol
IDL_Type: | double |
Units: | volt |
Description: Output gate tolerance
bias2_ogValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for OG at TestVolts
bias2_ogZeroErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for OG at 0V
bias2_rdCal
IDL_Type: | double |
Units: | unitless |
Description: RD convert factor
bias2_rdTestVolts
IDL_Type: | double |
Units: | volt |
Description: Shorts Test Voltage for RD
bias2_rdTol
IDL_Type: | double |
Units: | volt |
Description: Reset drain tolerance
bias2_rdValueErr
IDL_Type: | double |
Units: | volt |
Description: Tolerance for RD at TestVolts
bias2_rdZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for RD at 0V
clkhiAmin
Description: Minimum ON_State CLKHI (A) per REB
clkhiQmax
Description: Max OFF_State CLKHI (A) per REB
clkliAmin
Description: Minimum ON_State CLKLI (A) per REB
clkliQmax
Description: Max OFF_State CLKLI (A) per REB
dac_clkhIMax
Description: Max ClkHI value
dac_clklIMax
Description: Max ClkLI value
dac_pclkHighCal
IDL_Type: | double |
Units: | unitless |
Description: Parallel high calib
dac_pclkHighTestV
IDL_Type: | double |
Units: | Volt |
Description: Shorts Test Voltage for PClkU
dac_pclkHighTol
IDL_Type: | double |
Units: | volt |
Description: Parallel high tolerance
dac_pclkHighValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for PClkU TestV
dac_pclkHighZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for 0V w/PClkU test
dac_pclkLowCal
IDL_Type: | double |
Units: | unitless |
Description: Parallel low calib
dac_pclkLowTestV
IDL_Type: | double |
Units: | Volt |
Description: Shorts Test Voltage for PClkL
dac_pclkLowTol
IDL_Type: | double |
Units: | volt |
Description: Parallel low tolerance
dac_pclkLowValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for PClkL TestV
dac_pclkLowZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for 0V w/PClkL test
dac_rgHighCal
IDL_Type: | double |
Units: | unitless |
Description: Reset high calib
dac_rgHighTestV
IDL_Type: | double |
Units: | Volt |
Description: Shorts Test Voltage for RGU
dac_rgHighTol
IDL_Type: | double |
Units: | volt |
Description: Reset high tolerance
dac_rgHighValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for RGU TestV
dac_rgHighZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for 0V w/RGU test
dac_rgLowCal
IDL_Type: | double |
Units: | unitless |
Description: Reset low calib
dac_rgLowTestV
IDL_Type: | double |
Units: | Volt |
Description: Shorts Test Voltage for RGL
dac_rgLowTol
IDL_Type: | double |
Units: | volt |
Description: Reset low tolerance
dac_rgLowValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for RGL TestV
dac_rgLowZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for 0V w/RGL test
dac_sclkHighCal
IDL_Type: | double |
Units: | unitless |
Description: Serial high calib
dac_sclkHighTestV
IDL_Type: | double |
Units: | Volt |
Description: Shorts Test Voltage for SClkU
dac_sclkHighTol
IDL_Type: | double |
Units: | volt |
Description: Serial high tolerance
dac_sclkHighValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for SClkU TestV
dac_sclkHighZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for 0V w/SClkU test
dac_sclkLowCal
IDL_Type: | double |
Units: | unitless |
Description: Serial low calib
dac_sclkLowTestV
IDL_Type: | double |
Units: | Volt |
Description: Shorts Test Voltage for SClkL
dac_sclkLowTol
IDL_Type: | double |
Units: | volt |
Description: Serial low tolerance
dac_sclkLowValueErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for SClkL TestV
dac_sclkLowZeroErr
IDL_Type: | double |
Units: | Volt |
Description: Tolerance for 0V w/SClkL test
location
IDL_Type: | string |
Units: | unitless |
Description: Reb Location
maxDelta
IDL_Type: | double |
Units: | Volt |
Description: Max allowed SlowAdcs delta
maxStep
IDL_Type: | double |
Units: | Volt |
Description: Max allowed SlowAdcs step
minTol
IDL_Type: | double |
Units: | Volt |
Description: Min allowed SlowAdcs tolerance
nPowerOnPub
IDL_Type: | int |
Units: | unitless |
Description: Number of consequtive monitor-update pubs after trigger
odiAmin
Description: Minimum ON_State ODI (A) per CCD
odiQmax
Description: Max OFF_State ODI (A) per CCD
imageReadoutParameters
- Description: Event sent describing image readout parameters.
- Note: all : delimited strings (aka string arrays) follow the escaping convention defined in CAP-572
EFDB_Topic: | ATCamera_logevent_imageReadoutParameters |
imageName
IDL_Type: | string |
Units: | unitless |
Description: The imageName for this specific exposure
ccdLocation
IDL_Type: | string |
Units: | unitless |
Description: A list of all ccds currently configured, of the form RnnSnn, : delimited (empty if entry not used)
raftBay
IDL_Type: | string |
Units: | unitless |
Description: The raft bay for each CCD listed above, of the form Rnn : delimited
ccdSlot
IDL_Type: | string |
Units: | unitless |
Description: The CCD slot for each CCD listed above, of the form SXn : delimited
ccdType
IDL_Type: | int |
Units: | unitless |
Enumeration: | E2V,ITL |
Description: The type of each CCD, this determines segRows, segCols and serCols
overRows
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
overCols
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
readRows
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
readCols
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
readCols2
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
preCols
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
preRows
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
postCols
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
underCols
IDL_Type: | int |
Units: | unitless |
Description: See CCD Readout Parameters Diagram
daqFolder
IDL_Type: | string |
Units: | unitless |
Description: DAQ folder where image will be created
daqAnnotation
IDL_Type: | string |
Units: | unitless |
Description: Annotation sent to DAQ
shutterBladeMotionProfile
- Description: The motion profile for each shutter blade (so normally 2 per image).
- Note: Note this is overkill for ComCam, but aims to be the same as for the main camera.
For ComCam the encoder and hall effect measurements will be simulated, or empty (and probably initially empty).
Note 2: The coordinate system in which positions are reported is as yet ill-defined, and the origin (but not direction)
may vary between the 2 blades. The data to convert reported position to something more useful will be in the corresponding
blade configuration (aka settingsApplied). It is TBD whether we will try to take this out in the positions reported to SAL.
Note 3: The maximum number of positions reported by the firmware for both encoder position and hall effect hall sensors
is hard-wired to 240. This is used as the array dimension here. The actual number of points reported will be in
encoderCount and hallSensorCount. The array element values beyond the count are undefined (but probably 0)
EFDB_Topic: | ATCamera_logevent_shutterBladeMotionProfile |
blade
IDL_Type: | long |
Units: | unitless |
Enumeration: | PLUS_X,MINUS_X |
Description: The blade that is moving
direction
IDL_Type: | long |
Units: | unitless |
Enumeration: | OPEN,CLOSE |
Description: Is the blade opening or closing
timestampStart
IDL_Type: | double |
Units: | second |
Description: The time at which the motion started (TAI)
startPosition
Description: The start position of the blade
targetDuration
IDL_Type: | double |
Units: | second |
Description: Requested blade motion time
targetPosition
Description: Requested position at end of motion
endPosition
Description: Actual position and end of motion
actualDuration
IDL_Type: | double |
Units: | second |
Description: Actual blade motion time
hallSensorCount
IDL_Type: | int |
Units: | unitless |
Description: Actual number of hall sensor transitions
timestampHallSensor
IDL_Type: | double |
Units: | second |
Count: | 240 |
Description: Hall effect switch trasition times
hallSensorID
IDL_Type: | int |
Units: | unitless |
Count: | 240 |
Description: Which Hall effect switch trasitioned
hallSensorPosition
IDL_Type: | double |
Units: | mm |
Count: | 240 |
Description: Estimated position of the leading edge of the blade at transition time
hallSensorTransition
IDL_Type: | boolean |
Units: | unitless |
Count: | 240 |
Description: true if switch turned on, false if switch turned off
encoderCount
IDL_Type: | int |
Units: | unitless |
Description: Actual number of encoder measurements
timestampEncoder
IDL_Type: | double |
Units: | second |
Count: | 240 |
Description: timestamps for motor encoder position measurements (TAI)
encoderPosition
IDL_Type: | double |
Units: | mm |
Count: | 240 |
Description: Positions for motor encoder position measurements